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Large-scale scanning electron microscope (SEM) image and detailed
Coupled Broad Ion Beam–Scanning Electron Microscopy (BIB–SEM) for polishing and three dimensional (3D) serial section tomography (SST) - ScienceDirect
A) Overview SEM image at ×80 magnification of exactly the same sample
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PDF) RF 4H-SiC bipolar junction transistors
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Effect of the surface properties of resorcinol–formaldehyde resin/carbon nanocomposites and their carbonization products on the solid-phase extraction - RSC Advances (RSC Publishing) DOI:10.1039/C6RA25822K
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